substrato de matriz ativo, dispositivo de exibição, método para inspecionar o substrato de matriz ativa, e método para inspecionar o dispositivo de exibição

substrato de matriz ativo, dispositivo de exibição, método para inspecionar o substrato de matriz ativa, e método para inspecionar o dispositivo de exibição

An active matrix substrate (2) is provided with first connecting wirings (64 1 , 64 3 , 64 5 , 64 7 ) connected to gate terminals (51) to which extraction wirings (61 1 , 61 3 , 61 5 , 61 7 ) are connected, second connecting wirings (64 2 , 64 4 , 64 6 ) connected to gate terminals (51) to which ext...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: TAKEHIKO KAWAMURA, MASAHIRO YOSHIDA, KATSUHIRO OKADA
Format: Patent
Sprache:por
Schlagworte:
ADVERTISING
CRYPTOGRAPHY
DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH ISMODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THEDEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY,COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g.SWITCHING, GATING, MODULATING OR DEMODULATING
DISPLAY
DISPLAYING
EDUCATION
FREQUENCY-CHANGING
LABELS OR NAME-PLATES
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
NON-LINEAR OPTICS
OPTICAL ANALOGUE/DIGITAL CONVERTERS
OPTICAL LOGIC ELEMENTS
OPTICS
PHYSICS
SEALS
SIGNS
TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF
TESTING
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:An active matrix substrate (2) is provided with first connecting wirings (64 1 , 64 3 , 64 5 , 64 7 ) connected to gate terminals (51) to which extraction wirings (61 1 , 61 3 , 61 5 , 61 7 ) are connected, second connecting wirings (64 2 , 64 4 , 64 6 ) connected to gate terminals (51) to which extraction wirings (61 2 , 61 4 , 61 6 ) are connected, bundled wirings (65 1 to 65 4 ) each composed of a mutually adjacent first connecting wiring and second connecting wiring bundled together, a first inspection wiring (66) capable of inputting an inspection signal to bundled wirings (65 2 , 65 4 ) that are not adjacent to each other among the bundled wirings, and a second inspection wiring (67) capable of inputting an inspection signal to bundled wirings (65 1 , 65 3 ) that are not adjacent to each other and not connected to the first inspection wiring (66) among the bundled wirings.