método de medição de conformação

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Hauptverfasser: HIDETAKE KIRYU, HIROSHI OISHI, KENJI KURA, KENJIRO YAMASAKI, HIDEAKI YAMAMOTO
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creator HIDETAKE KIRYU
HIROSHI OISHI
KENJI KURA
KENJIRO YAMASAKI
HIDEAKI YAMAMOTO
description
format Patent
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recordid cdi_epo_espacenet_BR112013027644A2
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subjects CALCULATING
COMPUTING
COUNTING
IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
title método de medição de conformação
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