sistema para localizar em um substrato adaptado para separar fluidos tendo pelo menos duas superfícies e método para localizar vazamentos em um substrato

Bibliographische Detailangaben

Hauptverfasser:	STEWART P. WOOD, WILLIAM A. HEESCHEN
Format:	Patent
Sprache:	por
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PERFORMING OPERATIONS PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL PHYSICS SEPARATION TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR TRANSPORTING
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