Analytical method for nonmetallic contaminants in silicon
The present invention is a method for analyzing silicon for nonmetallic contaminants. The method comprises: (A) forming an alloy comprising silicon and a metal which promotes separation of nonmetallic contaminants present in the alloy, (B) separating the nonmetallic contaminants from the alloy, and...
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| Format: | Patent |
| Sprache: | eng |
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| Zusammenfassung: | The present invention is a method for analyzing silicon for nonmetallic contaminants. The method comprises: (A) forming an alloy comprising silicon and a metal which promotes separation of nonmetallic contaminants present in the alloy, (B) separating the nonmetallic contaminants from the alloy, and (C) analyzing the separated nonmetallic contaminants for chemical content. The present invention is particularly useful for analyzing metallurgical grade silicon intended for use in the direct process for the production of organohalosilanes for the presence of oxides and carbides of calcium, aluminum and silicon. |
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