PACER DEMAND - RATE TEST MODE CONTROL

In an implanted heart stimulating device of the demand type, test mode circuitry is arranged to cause the temporary generation of stimulation impulses at the demand-rate in the presence of naturally occurring heartbeats. The test mode circuitry may cause dependence of the heart-stimulation rate upon the level of the power source within the test mode or at least a portion of the test mode, but is arranged to provide a heart-stimulation rate independent of the level of the power source in the ordinary demand mode. The test mode circuitry is operative, through a relatively simple bias-modifying circuit, to force the pacer to generate at least several stimulating impulses at the demand-rate immediately following cessation of that portion of the test mode in which stimulation impulses are generated at a rate dependent upon the level of the power source. Subsequently, the pacer reverts to the ordinary (i.e., non-forced) demand mode.