Material imaging system and method
An imaging system for earthen material, including a support structure adjacent an image location for a pathway of earthen material exposed to varying and uncontrolled illumination and/or artificial illumination, a spectral imager and a reference device each mounted to the support structure, the spec...
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| creator | McKinley, Timothy A Alhumsi, Obada |
| description | An imaging system for earthen material, including a support structure adjacent an image location for a pathway of earthen material exposed to varying and uncontrolled illumination and/or artificial illumination, a spectral imager and a reference device each mounted to the support structure, the spectral imager directed at the image location and arranged to measure an intensity of illumination reflected from earthen material at the image location. 1104- 6 132 124 1217112 |
| format | Patent |
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ELECTRIC COMMUNICATION TECHNIQUE ; ELECTRICITY ; MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT ; MEASURING ; PHYSICS ; PICTORIAL COMMUNICATION, e.g. TELEVISION ; RADIATION PYROMETRY ; TESTING</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20241017&DB=EPODOC&CC=AU&NR=2023216781A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20241017&DB=EPODOC&CC=AU&NR=2023216781A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>McKinley, Timothy A</creatorcontrib><creatorcontrib>Alhumsi, Obada</creatorcontrib><title>Material imaging system and method</title><description>An imaging system for earthen material, including a support structure adjacent an image location for a pathway of earthen material exposed to varying and uncontrolled illumination and/or artificial illumination, a spectral imager and a reference device each mounted to the support structure, the spectral imager directed at the image location and arranged to measure an intensity of illumination reflected from earthen material at the image location. 1104- 6 132 124 1217112</description><subject>COLORIMETRY</subject><subject>ELECTRIC COMMUNICATION TECHNIQUE</subject><subject>ELECTRICITY</subject><subject>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>PICTORIAL COMMUNICATION, e.g. TELEVISION</subject><subject>RADIATION PYROMETRY</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFDyTSxJLcpMzFHIzE1Mz8xLVyiuLC5JzVVIzEtRyE0tychP4WFgTUvMKU7lhdLcDMpuriHOHrqpBfnxqcUFicmpeakl8Y6hRgZGxkaGZuYWho6GxsSpAgA8uya9</recordid><startdate>20241017</startdate><enddate>20241017</enddate><creator>McKinley, Timothy A</creator><creator>Alhumsi, Obada</creator><scope>EVB</scope></search><sort><creationdate>20241017</creationdate><title>Material imaging system and method</title><author>McKinley, Timothy A ; 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| language | eng |
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| subjects | COLORIMETRY ELECTRIC COMMUNICATION TECHNIQUE ELECTRICITY MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING PHYSICS PICTORIAL COMMUNICATION, e.g. TELEVISION RADIATION PYROMETRY TESTING |
| title | Material imaging system and method |
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