Material imaging system and method

Material imaging system and method

An imaging system for earthen material, including a support structure adjacent an image location for a pathway of earthen material exposed to varying and uncontrolled illumination and/or artificial illumination, a spectral imager and a reference device each mounted to the support structure, the spec...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: McKinley, Timothy A, Alhumsi, Obada
Format: Patent
Sprache:eng
Schlagworte:
COLORIMETRY
ELECTRIC COMMUNICATION TECHNIQUE
ELECTRICITY
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT
MEASURING
PHYSICS
PICTORIAL COMMUNICATION, e.g. TELEVISION
RADIATION PYROMETRY
TESTING
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Beschreibung
Zusammenfassung:An imaging system for earthen material, including a support structure adjacent an image location for a pathway of earthen material exposed to varying and uncontrolled illumination and/or artificial illumination, a spectral imager and a reference device each mounted to the support structure, the spectral imager directed at the image location and arranged to measure an intensity of illumination reflected from earthen material at the image location. 1104- 6 132 124 1217112