Methods, systems, and devices for calibration and optimization of glucose sensors and sensor output

Methods, Systems, and Devices for Calibration and Optimization of Glucose Sensors and Sensor Output A method for using factory calibration to correct for manufacturing batch variations in one or more sensor parameters of a glucose sensor used for measuring the level of glucose in the body of a user,...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: NISHIDA, Jeffrey, JACKS, Steven C, KANNARD, Brian T, AJEMBA, Peter, TSAI, Andy Y, MILLER, Michael E, NOGUEIRA, Keith, VARSAVSKY, Andrea
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:Methods, Systems, and Devices for Calibration and Optimization of Glucose Sensors and Sensor Output A method for using factory calibration to correct for manufacturing batch variations in one or more sensor parameters of a glucose sensor used for measuring the level of glucose in the body of a user, said sensor including physical sensor electronics, a microcontroller, and a working electrode, the method comprising: periodically measuring, by the physical sensor electronics, electrode current (Isig) signal values for the working electrode; performing, by the microcontroller, an Electrochemical Impedance Spectroscopy (EIS) procedure to generate values of one or more EIS-related parameters for the working electrode; calculating, by the microcontroller, values of counter voltage (Vcntr) for the sensor; applying, by said microcontroller, a factory calibration factor to said Isig, EIS parameter, and Vcntr values to generate respective modified Isig, EIS parameter, and Vcntr values; based on the modified Isig, EIS parameter, and Vcntr values and a plurality of calibration free sensor glucose (SG)-predictive models, calculating, by the microcontroller, a respective SG value for each of the SO-predictive models; fusing, by the microcontroller, the respective SO values to calculate a single, fused SO value; performing, by the microcontroller, error detection diagnostics on said calibrated, fused SO value to determine whether a correctable error exists in the calibrated, fused, SO value; correcting, by the microcontroller, said correctable error; and displaying a corrected, calibrated, fused SO value to the user.