Inspection support system

Provided is an inspection assistance system that can improve work efficiency or work accuracy pertaining to the inspection of structures. The present invention is characterized in that: a self-traveling device 100 self-travels to a target position on the basis of a travel command based on a first in...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	YAMASAKI, Fuminori, KARINO, Takashi
Format:	Patent
Sprache:	eng
Schlagworte:	CONTROLLING INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS REGULATING SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES TESTING
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Beschreibung
Zusammenfassung:	Provided is an inspection assistance system that can improve work efficiency or work accuracy pertaining to the inspection of structures. The present invention is characterized in that: a self-traveling device 100 self-travels to a target position on the basis of a travel command based on a first inspection image, and captures an image of an imaging target included in the first inspection image to acquire a second inspection image; and an information processing device 200 extracts a conforming target suitable for the imaging target included in the first inspection image, from among imaging targets included in the second inspection image, and associates, with the conforming target, specific information that identifiably specifies the imaging target included in the first inspection image conforming to the conforming target.