Systems and methods for determining a thickness of a nonaqueous phase liquid layer

Systems and methods for determining a thickness of a nonaqueous phase liquid layer

Various embodiments relate to systems and methods for determining a thickness of a nonaqueous phase liquid layer (NAPL) that is disposed adjacent a second layer of aqueous phase liquid (APL). The system can include a pressure transducer assembly having a total density value between a first density v...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: GAITO, Steven Thomas, KOONS, Brad William, GAJJAR, Monal, BUCKLEY, Daniel Avery
Format: Patent
Sprache:eng
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:Various embodiments relate to systems and methods for determining a thickness of a nonaqueous phase liquid layer (NAPL) that is disposed adjacent a second layer of aqueous phase liquid (APL). The system can include a pressure transducer assembly having a total density value between a first density value of the NAPL and a second density value of the APL. The pressure transducer assembly can be configured to measure a first pressure associated with the pressure exerted by the first layer.