X-ray fluorescence analyzer with a plurality of measurement channels, and a method for performing X-ray fluorescence analysis

An X-ray fluorescence analyzer comprises an X-ray tube (402) for emitting incident X-rays (206) in the direction of a first optical axis (204). A slurry handling unit (201) is configured to maintain a constant distance between a sample (202) of slurry and said X-ray tube. A first crystal diffractor...

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Bibliographische Detailangaben
Hauptverfasser:	KOSKINEN, Tommi, SIPILÄ, Heikki, PELLI, Antti
Format:	Patent
Sprache:	eng
Schlagworte:	CHEMISTRY FERROUS OR NON-FERROUS ALLOYS GAMMA RAY OR X-RAY MICROSCOPES INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES IRRADIATION DEVICES MAGNETIC OR ELECTROSTATIC SEPARATION OF SOLID MATERIALS FROM SOLIDMATERIALS OR FLUIDS MEASUREMENT OF NUCLEAR OR X-RADIATION MEASURING METALLURGY NUCLEAR ENGINEERING NUCLEAR PHYSICS PERFORMING OPERATIONS PHYSICS PRETREATMENT OF RAW MATERIALS PRODUCTION AND REFINING OF METALS SEPARATING SOLID MATERIALS USING LIQUIDS OR USING PNEUMATICTABLES OR JIGS SEPARATION BY HIGH-VOLTAGE ELECTRIC FIELDS SEPARATION OF SOLID MATERIALS USING LIQUIDS OR USING PNEUMATICTABLES OR JIGS TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOTOTHERWISE PROVIDED FOR TESTING TRANSPORTING TREATMENT OF ALLOYS OR NON-FERROUS METALS
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Beschreibung
Zusammenfassung:	An X-ray fluorescence analyzer comprises an X-ray tube (402) for emitting incident X-rays (206) in the direction of a first optical axis (204). A slurry handling unit (201) is configured to maintain a constant distance between a sample (202) of slurry and said X-ray tube. A first crystal diffractor (601, 1501) is located in a first direction from said slurry handling unit (201). It comprises a first crystal (603, 1502) and a first radiation detector (602, 1505) configured to detect fluorescent X-rays diffracted by said first crystal (603, 1502) at a first energy resolution. A second crystal diffractor (1511) is located in a second direction from said slurry handling unit (201). It comprises a second crystal (1512) and a second radiation detector (1515) configured to detect fluorescent X-rays diffracted by said second crystal (1512) at a second energy resolution. Said first crystal (603, 1502) is a pyrolytic graphite crystal, said second crystal (1512) is of a material other than pyrolytic graphite, and said first and second crystal diffractors are configured to direct to their respective radiation detectors characteristic fluorescent radiation of a same element.