System and method for estimating instrument location

Systems and methods for estimating instrument location are described. The methods and systems can obtain a first motion estimate based on robotic data and a second motion estimate based on position sensor data. The methods and systems can determine a motion estimate disparity based on a comparison o...

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Hauptverfasser:	JEEVAN, Prasanth, RAFII-TARI, Hedyeh, LIM, Simon Wei Quan, UMMALANENI, Ritwik
Format:	Patent
Sprache:	eng
Schlagworte:	CHAMBERS PROVIDED WITH MANIPULATION DEVICES DIAGNOSIS HAND TOOLS HUMAN NECESSITIES HYGIENE IDENTIFICATION MANIPULATORS MEDICAL OR VETERINARY SCIENCE PERFORMING OPERATIONS PORTABLE POWER-DRIVEN TOOLS SURGERY TRANSPORTING
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Beschreibung
Zusammenfassung:	Systems and methods for estimating instrument location are described. The methods and systems can obtain a first motion estimate based on robotic data and a second motion estimate based on position sensor data. The methods and systems can determine a motion estimate disparity based on a comparison of the first and second motion estimates. Based on the motion estimate disparity, the methods and systems can update a weighting factor for a location derivable from the robotic data or a weighting factor for a location derivable from the position sensor data. Based on the updated weighting factor, the methods and systems can determine a location/position estimate for the instrument. The methods and systems can provide increased accuracy for a position estimate in cases where the instrument experiences buckling or hysteresis.