SYSTEMS AND METHODS FOR PERFORMING MEASUREMENTS OF ONE OR MORE MATERIALS

Systems and methods for performing measurements of one or more materials are provided. One system is configured to transfer one or more materials to an imaging volume 5 of a measurement device from one or more storage vessels. Another system is configured to image one or more materials in an imaging...

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Hauptverfasser: ROACH, ROBERT S, BOZARTH, COLIN D, SMITH, DAVID L, SCHILFFARTH, ADAM R, KRAGER, JARDEN E, CONNER, DONALD A, ARAB, NICOLAS F, COLLINS, CHARLES J, BERNARD, BRUCE J. C, JOHNSON, ROSS G, ROTH, WAYNE D, CALVIN, EDWARD A, DEICHER, WILLIAM R, SELVARAJ, VICTOR, SMITH, ERIC D
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creator ROACH, ROBERT S
BOZARTH, COLIN D
SMITH, DAVID L
SCHILFFARTH, ADAM R
KRAGER, JARDEN E
CONNER, DONALD A
ARAB, NICOLAS F
COLLINS, CHARLES J
BERNARD, BRUCE J. C
JOHNSON, ROSS G
ROTH, WAYNE D
CALVIN, EDWARD A
DEICHER, WILLIAM R
SELVARAJ, VICTOR
SMITH, ERIC D
description Systems and methods for performing measurements of one or more materials are provided. One system is configured to transfer one or more materials to an imaging volume 5 of a measurement device from one or more storage vessels. Another system is configured to image one or more materials in an imaging volume of a measurement device. An additional system is configured to substantially immobilize one or more materials in an imaging volume of a measurement device. A further system is configured to transfer one or more materials to an imaging volume of a measurement device from one or more storage vessels, to image 10 the one or more materials in the imaging volume, to substantially immobilize the one or more materials in the imaging volume, or some combination thereof. m N m j0 C-C) I!' a_ Lij ED)L m i - - - -- -- - - - -- - -- - - -- :
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_AU2014250695BB2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>AU2014250695BB2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_AU2014250695BB23</originalsourceid><addsrcrecordid>eNrjZPAIjgwOcfUNVnD0c1HwdQ3x8HcJVnDzD1IIcA0CUr6efu5AYcfg0CBXX1e_kGAFfzcFfz9XBaAKX_8gVwVfxxDXIE9Hn2AeBta0xJziVF4ozc2g4uYa4uyhm1qQH59aXJCYnJqXWhLvGGpkYGhiZGpgZmnq5GRkTKQyACZ2LlI</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>SYSTEMS AND METHODS FOR PERFORMING MEASUREMENTS OF ONE OR MORE MATERIALS</title><source>esp@cenet</source><creator>ROACH, ROBERT S ; BOZARTH, COLIN D ; SMITH, DAVID L ; SCHILFFARTH, ADAM R ; KRAGER, JARDEN E ; CONNER, DONALD A ; ARAB, NICOLAS F ; COLLINS, CHARLES J ; BERNARD, BRUCE J. C ; JOHNSON, ROSS G ; ROTH, WAYNE D ; CALVIN, EDWARD A ; DEICHER, WILLIAM R ; SELVARAJ, VICTOR ; SMITH, ERIC D</creator><creatorcontrib>ROACH, ROBERT S ; BOZARTH, COLIN D ; SMITH, DAVID L ; SCHILFFARTH, ADAM R ; KRAGER, JARDEN E ; CONNER, DONALD A ; ARAB, NICOLAS F ; COLLINS, CHARLES J ; BERNARD, BRUCE J. C ; JOHNSON, ROSS G ; ROTH, WAYNE D ; CALVIN, EDWARD A ; DEICHER, WILLIAM R ; SELVARAJ, VICTOR ; SMITH, ERIC D</creatorcontrib><description>Systems and methods for performing measurements of one or more materials are provided. One system is configured to transfer one or more materials to an imaging volume 5 of a measurement device from one or more storage vessels. Another system is configured to image one or more materials in an imaging volume of a measurement device. An additional system is configured to substantially immobilize one or more materials in an imaging volume of a measurement device. A further system is configured to transfer one or more materials to an imaging volume of a measurement device from one or more storage vessels, to image 10 the one or more materials in the imaging volume, to substantially immobilize the one or more materials in the imaging volume, or some combination thereof. m N m j0 C-C) I!' a_ Lij ED)L m i - - - -- -- - - - -- - -- - - -- :</description><language>eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2014</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20141211&amp;DB=EPODOC&amp;CC=AU&amp;NR=2014250695B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20141211&amp;DB=EPODOC&amp;CC=AU&amp;NR=2014250695B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>ROACH, ROBERT S</creatorcontrib><creatorcontrib>BOZARTH, COLIN D</creatorcontrib><creatorcontrib>SMITH, DAVID L</creatorcontrib><creatorcontrib>SCHILFFARTH, ADAM R</creatorcontrib><creatorcontrib>KRAGER, JARDEN E</creatorcontrib><creatorcontrib>CONNER, DONALD A</creatorcontrib><creatorcontrib>ARAB, NICOLAS F</creatorcontrib><creatorcontrib>COLLINS, CHARLES J</creatorcontrib><creatorcontrib>BERNARD, BRUCE J. C</creatorcontrib><creatorcontrib>JOHNSON, ROSS G</creatorcontrib><creatorcontrib>ROTH, WAYNE D</creatorcontrib><creatorcontrib>CALVIN, EDWARD A</creatorcontrib><creatorcontrib>DEICHER, WILLIAM R</creatorcontrib><creatorcontrib>SELVARAJ, VICTOR</creatorcontrib><creatorcontrib>SMITH, ERIC D</creatorcontrib><title>SYSTEMS AND METHODS FOR PERFORMING MEASUREMENTS OF ONE OR MORE MATERIALS</title><description>Systems and methods for performing measurements of one or more materials are provided. One system is configured to transfer one or more materials to an imaging volume 5 of a measurement device from one or more storage vessels. Another system is configured to image one or more materials in an imaging volume of a measurement device. An additional system is configured to substantially immobilize one or more materials in an imaging volume of a measurement device. A further system is configured to transfer one or more materials to an imaging volume of a measurement device from one or more storage vessels, to image 10 the one or more materials in the imaging volume, to substantially immobilize the one or more materials in the imaging volume, or some combination thereof. m N m j0 C-C) I!' a_ Lij ED)L m i - - - -- -- - - - -- - -- - - -- :</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2014</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZPAIjgwOcfUNVnD0c1HwdQ3x8HcJVnDzD1IIcA0CUr6efu5AYcfg0CBXX1e_kGAFfzcFfz9XBaAKX_8gVwVfxxDXIE9Hn2AeBta0xJziVF4ozc2g4uYa4uyhm1qQH59aXJCYnJqXWhLvGGpkYGhiZGpgZmnq5GRkTKQyACZ2LlI</recordid><startdate>20141211</startdate><enddate>20141211</enddate><creator>ROACH, ROBERT S</creator><creator>BOZARTH, COLIN D</creator><creator>SMITH, DAVID L</creator><creator>SCHILFFARTH, ADAM R</creator><creator>KRAGER, JARDEN E</creator><creator>CONNER, DONALD A</creator><creator>ARAB, NICOLAS F</creator><creator>COLLINS, CHARLES J</creator><creator>BERNARD, BRUCE J. C</creator><creator>JOHNSON, ROSS G</creator><creator>ROTH, WAYNE D</creator><creator>CALVIN, EDWARD A</creator><creator>DEICHER, WILLIAM R</creator><creator>SELVARAJ, VICTOR</creator><creator>SMITH, ERIC D</creator><scope>EVB</scope></search><sort><creationdate>20141211</creationdate><title>SYSTEMS AND METHODS FOR PERFORMING MEASUREMENTS OF ONE OR MORE MATERIALS</title><author>ROACH, ROBERT S ; BOZARTH, COLIN D ; SMITH, DAVID L ; SCHILFFARTH, ADAM R ; KRAGER, JARDEN E ; CONNER, DONALD A ; ARAB, NICOLAS F ; COLLINS, CHARLES J ; BERNARD, BRUCE J. C ; JOHNSON, ROSS G ; ROTH, WAYNE D ; CALVIN, EDWARD A ; DEICHER, WILLIAM R ; SELVARAJ, VICTOR ; SMITH, ERIC D</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_AU2014250695BB23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2014</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>ROACH, ROBERT S</creatorcontrib><creatorcontrib>BOZARTH, COLIN D</creatorcontrib><creatorcontrib>SMITH, DAVID L</creatorcontrib><creatorcontrib>SCHILFFARTH, ADAM R</creatorcontrib><creatorcontrib>KRAGER, JARDEN E</creatorcontrib><creatorcontrib>CONNER, DONALD A</creatorcontrib><creatorcontrib>ARAB, NICOLAS F</creatorcontrib><creatorcontrib>COLLINS, CHARLES J</creatorcontrib><creatorcontrib>BERNARD, BRUCE J. C</creatorcontrib><creatorcontrib>JOHNSON, ROSS G</creatorcontrib><creatorcontrib>ROTH, WAYNE D</creatorcontrib><creatorcontrib>CALVIN, EDWARD A</creatorcontrib><creatorcontrib>DEICHER, WILLIAM R</creatorcontrib><creatorcontrib>SELVARAJ, VICTOR</creatorcontrib><creatorcontrib>SMITH, ERIC D</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>ROACH, ROBERT S</au><au>BOZARTH, COLIN D</au><au>SMITH, DAVID L</au><au>SCHILFFARTH, ADAM R</au><au>KRAGER, JARDEN E</au><au>CONNER, DONALD A</au><au>ARAB, NICOLAS F</au><au>COLLINS, CHARLES J</au><au>BERNARD, BRUCE J. C</au><au>JOHNSON, ROSS G</au><au>ROTH, WAYNE D</au><au>CALVIN, EDWARD A</au><au>DEICHER, WILLIAM R</au><au>SELVARAJ, VICTOR</au><au>SMITH, ERIC D</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>SYSTEMS AND METHODS FOR PERFORMING MEASUREMENTS OF ONE OR MORE MATERIALS</title><date>2014-12-11</date><risdate>2014</risdate><abstract>Systems and methods for performing measurements of one or more materials are provided. One system is configured to transfer one or more materials to an imaging volume 5 of a measurement device from one or more storage vessels. Another system is configured to image one or more materials in an imaging volume of a measurement device. An additional system is configured to substantially immobilize one or more materials in an imaging volume of a measurement device. A further system is configured to transfer one or more materials to an imaging volume of a measurement device from one or more storage vessels, to image 10 the one or more materials in the imaging volume, to substantially immobilize the one or more materials in the imaging volume, or some combination thereof. m N m j0 C-C) I!' a_ Lij ED)L m i - - - -- -- - - - -- - -- - - -- :</abstract><oa>free_for_read</oa></addata></record>
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language eng
recordid cdi_epo_espacenet_AU2014250695BB2
source esp@cenet
subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title SYSTEMS AND METHODS FOR PERFORMING MEASUREMENTS OF ONE OR MORE MATERIALS
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-05T13%3A06%3A51IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=ROACH,%20ROBERT%20S&rft.date=2014-12-11&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EAU2014250695BB2%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true