SYSTEMS AND METHODS FOR PERFORMING MEASUREMENTS OF ONE OR MORE MATERIALS
Systems and methods for performing measurements of one or more materials are provided. One system is configured to transfer one or more materials to an imaging volume 5 of a measurement device from one or more storage vessels. Another system is configured to image one or more materials in an imaging...
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creator | ROACH, ROBERT S BOZARTH, COLIN D SMITH, DAVID L SCHILFFARTH, ADAM R KRAGER, JARDEN E CONNER, DONALD A ARAB, NICOLAS F COLLINS, CHARLES J BERNARD, BRUCE J. C JOHNSON, ROSS G ROTH, WAYNE D CALVIN, EDWARD A DEICHER, WILLIAM R SELVARAJ, VICTOR SMITH, ERIC D |
description | Systems and methods for performing measurements of one or more materials are provided. One system is configured to transfer one or more materials to an imaging volume 5 of a measurement device from one or more storage vessels. Another system is configured to image one or more materials in an imaging volume of a measurement device. An additional system is configured to substantially immobilize one or more materials in an imaging volume of a measurement device. A further system is configured to transfer one or more materials to an imaging volume of a measurement device from one or more storage vessels, to image 10 the one or more materials in the imaging volume, to substantially immobilize the one or more materials in the imaging volume, or some combination thereof. m N m j0 C-C) I!' a_ Lij ED)L m i - - - -- -- - - - -- - -- - - -- : |
format | Patent |
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A further system is configured to transfer one or more materials to an imaging volume of a measurement device from one or more storage vessels, to image 10 the one or more materials in the imaging volume, to substantially immobilize the one or more materials in the imaging volume, or some combination thereof. m N m j0 C-C) I!' a_ Lij ED)L m i - - - -- -- - - - -- - -- - - -- :</description><language>eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2014</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20141211&DB=EPODOC&CC=AU&NR=2014250695B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20141211&DB=EPODOC&CC=AU&NR=2014250695B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>ROACH, ROBERT S</creatorcontrib><creatorcontrib>BOZARTH, COLIN D</creatorcontrib><creatorcontrib>SMITH, DAVID L</creatorcontrib><creatorcontrib>SCHILFFARTH, ADAM R</creatorcontrib><creatorcontrib>KRAGER, JARDEN E</creatorcontrib><creatorcontrib>CONNER, DONALD A</creatorcontrib><creatorcontrib>ARAB, NICOLAS F</creatorcontrib><creatorcontrib>COLLINS, CHARLES J</creatorcontrib><creatorcontrib>BERNARD, BRUCE J. 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A further system is configured to transfer one or more materials to an imaging volume of a measurement device from one or more storage vessels, to image 10 the one or more materials in the imaging volume, to substantially immobilize the one or more materials in the imaging volume, or some combination thereof. m N m j0 C-C) I!' a_ Lij ED)L m i - - - -- -- - - - -- - -- - - -- :</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2014</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZPAIjgwOcfUNVnD0c1HwdQ3x8HcJVnDzD1IIcA0CUr6efu5AYcfg0CBXX1e_kGAFfzcFfz9XBaAKX_8gVwVfxxDXIE9Hn2AeBta0xJziVF4ozc2g4uYa4uyhm1qQH59aXJCYnJqXWhLvGGpkYGhiZGpgZmnq5GRkTKQyACZ2LlI</recordid><startdate>20141211</startdate><enddate>20141211</enddate><creator>ROACH, ROBERT S</creator><creator>BOZARTH, COLIN D</creator><creator>SMITH, DAVID L</creator><creator>SCHILFFARTH, ADAM R</creator><creator>KRAGER, JARDEN E</creator><creator>CONNER, DONALD A</creator><creator>ARAB, NICOLAS F</creator><creator>COLLINS, CHARLES J</creator><creator>BERNARD, BRUCE J. 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C</au><au>JOHNSON, ROSS G</au><au>ROTH, WAYNE D</au><au>CALVIN, EDWARD A</au><au>DEICHER, WILLIAM R</au><au>SELVARAJ, VICTOR</au><au>SMITH, ERIC D</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>SYSTEMS AND METHODS FOR PERFORMING MEASUREMENTS OF ONE OR MORE MATERIALS</title><date>2014-12-11</date><risdate>2014</risdate><abstract>Systems and methods for performing measurements of one or more materials are provided. One system is configured to transfer one or more materials to an imaging volume 5 of a measurement device from one or more storage vessels. Another system is configured to image one or more materials in an imaging volume of a measurement device. An additional system is configured to substantially immobilize one or more materials in an imaging volume of a measurement device. A further system is configured to transfer one or more materials to an imaging volume of a measurement device from one or more storage vessels, to image 10 the one or more materials in the imaging volume, to substantially immobilize the one or more materials in the imaging volume, or some combination thereof. m N m j0 C-C) I!' a_ Lij ED)L m i - - - -- -- - - - -- - -- - - -- :</abstract><oa>free_for_read</oa></addata></record> |
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subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
title | SYSTEMS AND METHODS FOR PERFORMING MEASUREMENTS OF ONE OR MORE MATERIALS |
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