SYSTEMS AND METHODS FOR PERFORMING MEASUREMENTS OF ONE OR MORE MATERIALS

Systems and methods for performing measurements of one or more materials are provided. One system is configured to transfer one or more materials to an imaging volume 5 of a measurement device from one or more storage vessels. Another system is configured to image one or more materials in an imaging...

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Bibliographische Detailangaben
Hauptverfasser:	ROACH, ROBERT S, BOZARTH, COLIN D, SMITH, DAVID L, SCHILFFARTH, ADAM R, KRAGER, JARDEN E, CONNER, DONALD A, ARAB, NICOLAS F, COLLINS, CHARLES J, BERNARD, BRUCE J. C, JOHNSON, ROSS G, ROTH, WAYNE D, CALVIN, EDWARD A, DEICHER, WILLIAM R, SELVARAJ, VICTOR, SMITH, ERIC D
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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Beschreibung
Zusammenfassung:	Systems and methods for performing measurements of one or more materials are provided. One system is configured to transfer one or more materials to an imaging volume 5 of a measurement device from one or more storage vessels. Another system is configured to image one or more materials in an imaging volume of a measurement device. An additional system is configured to substantially immobilize one or more materials in an imaging volume of a measurement device. A further system is configured to transfer one or more materials to an imaging volume of a measurement device from one or more storage vessels, to image 10 the one or more materials in the imaging volume, to substantially immobilize the one or more materials in the imaging volume, or some combination thereof. m N m j0 C-C) I!' a_ Lij ED)L m i - - - -- -- - - - -- - -- - - -- :