Stitch quality monitoring system

A stitcher is provided that includes a needle configured to place stitches in a fabric that is moved therethrough. The stitcher includes a sensor positioned below the fabric to monitor stitches placed in the fabric. A microcontroller is provided configured to receive data from the sensor and, based...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	STOKES, THEODORE J, SHERMAN, MATTHEW PAUL, STATLER, PAUL, BAUMAN, JOSEPH W, EUBANKS, KENNETH MARK
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING EMBROIDERING PHYSICS SEWING TEXTILES TUFTING
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