Stitch quality monitoring system

A stitcher is provided that includes a needle configured to place stitches in a fabric that is moved therethrough. The stitcher includes a sensor positioned below the fabric to monitor stitches placed in the fabric. A microcontroller is provided configured to receive data from the sensor and, based...

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Bibliographische Detailangaben
Hauptverfasser:	STOKES, THEODORE J, SHERMAN, MATTHEW PAUL, STATLER, PAUL, BAUMAN, JOSEPH W, EUBANKS, KENNETH MARK
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING EMBROIDERING PHYSICS SEWING TEXTILES TUFTING
Online-Zugang:	Volltext bestellen
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Beschreibung
Zusammenfassung:	A stitcher is provided that includes a needle configured to place stitches in a fabric that is moved therethrough. The stitcher includes a sensor positioned below the fabric to monitor stitches placed in the fabric. A microcontroller is provided configured to receive data from the sensor and, based on such data, to compare one or more attributes of the monitored stitches with one or more predetermined parameters relating at least one attribute of the fabric. The predetermined parameter may be either hardcoded inn the microcontroller or input by a user of the stitcher prior to beginning operation of the machine. When the attributes of the monitored stitches fall outside of the predetermined parameters, the microcontroller initiates notification of the user.