Methods and systems for processing microseismic data

Methods and systems for processing microseismic waveforms. The methods and systems provide determining a measure of waveform fit in the frequency-domain comprising constructing, in the frequency-domain, at least one of an amplitude misfit functional and a cross phase functional between arrivals; and...

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Bibliographische Detailangaben
1. Verfasser: LEANEY, W. SCOTT
Format: Patent
Sprache:eng
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Zusammenfassung:Methods and systems for processing microseismic waveforms. The methods and systems provide determining a measure of waveform fit in the frequency-domain comprising constructing, in the frequency-domain, at least one of an amplitude misfit functional and a cross phase functional between arrivals; and estimating source parameters and/or model parameters.