METHOD AND APPARATUS FOR ELECTRONIC PART INSPECTION

METHOD AND APPARATUS FOR ELECTRONIC PART INSPECTION

Apparatus and method for inspecting electronic parts are provided. The apparatus includes a feeding part for feeding an electronic part, a feeder for moving the electronic part fed from the feeding part by using a vibration, and inspecting means disposed over the feeder to photograph respective surf...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: HAN-JONG YOON, YUN-KEUN PARK, EUI-JONG AHN, YOUNG-TAK SHON, MIN-SEOK HEO
Format: Patent
Sprache:eng
Schlagworte:
CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS
ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
PRINTED CIRCUITS
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Beschreibung
Zusammenfassung:Apparatus and method for inspecting electronic parts are provided. The apparatus includes a feeding part for feeding an electronic part, a feeder for moving the electronic part fed from the feeding part by using a vibration, and inspecting means disposed over the feeder to photograph respective surfaces of the electronic part moving through the feeder. The feeder has a transfer path comprising V-shaped grooves so as to move toward and rotate at a determined angle in one direction. In order to rotate electronic parts, the V-shaped groove is formed to gradually vary the left and right tilt angles according to the proceeding direction of the electronic part.