VORRICHTUNG ZUM BELEUCHTEN VON BAUTEILEN AUS TRANSPARENTEM MATERIAL BEI DER FEHLERPRUEFUNG

A device for illuminating components of transparent material by dot-scanning so that the components may be tested for surface irregularities and occlusions which comprises a component rotatably mounted so that the component may be rotated on its axis at a predetermined speed, a light source for gene...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	SCHMALFUSS, HARALD, SINSEL, FRIEDEL, BOLZ, REINHOLD
Format:	Patent
Sprache:	ger
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS PHYSICS TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
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Beschreibung
Zusammenfassung:	A device for illuminating components of transparent material by dot-scanning so that the components may be tested for surface irregularities and occlusions which comprises a component rotatably mounted so that the component may be rotated on its axis at a predetermined speed, a light source for generating a parallel light beam for illuminating the component, and a mechanism for periodically linearly deflecting the light beam at a frequency greater than the predetermined rotational speed of the component. The periodically linearly deflecting mechanism is disposed in the path of the light beam between the parallel light beam generating source and the component. The device also includes a focusing lens for focusing the light beam in a testing plane, where the focusing lens is disposed between the periodically linearly deflecting mechanism and the component at a location whereby the focal point of the focusing lens is at the edge of the periodically linearly deflecting mechanism. The device further includes an adjustable tilting mirror disposed between the focusing lens and the component for deflecting the light beam onto the component, whereby the dot-scanning light beam can then be detected by a testing device.