VERFAHREN UND VORRICHTUNG ZUR DIAGNOSE MEHRFACHER FEHLER IN MATERIALEN

The method involves projecting a shape vector in sub-spaces respectively associated M simple identified failures occurred in failure equipment among equipments (V1-V4), to obtain M shape sub-vectors, by using a processing module (MT). Values representing similarities between each shape sub-vector and prototype vectors of a simple failure database (X) are calculated, where the prototype vectors represent one identified simple failure and a group of M-1 simple failures excluding the identified simple failure. The similarity values of one simple failure of the failure equipment are deduced. An independent claim is also included for a device for diagnosing multiple failures occurring in an equipment.