NICHTLINEARES ECHTZEIT-3D-MIKROSKOPMESSYSTEM UND VERFAHREN ZU SEINER ANWENDUNG

A real-time, 3D, non-linear microscope measuring system and method for examining a set of microscopic image points in different image planes. The system comprises a pulsed laser or parametric oscillator light source generating an examining optical signal, and is applicable to measure and/or photoche...

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Bibliographische Detailangaben
Hauptverfasser: MAAK, PAL, OSVAY, KAROLY, ROZSA, BALAZS, VALENTA, LASZLO, SZIPOCS, ROBERT, FEKETE, JULIA, KATONA, GERGELY, VIZI E., SZILVESZTER, KALLO, PETER
Format: Patent
Sprache:ger
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Beschreibung
Zusammenfassung:A real-time, 3D, non-linear microscope measuring system and method for examining a set of microscopic image points in different image planes. The system comprises a pulsed laser or parametric oscillator light source generating an examining optical signal, and is applicable to measure and/or photochemically stimulate pre-selected points within a short time interval. The system further comprises a bundle of fibers composed of optical fibers or other waveguides, a rapidly working optical switch, a imaging system, a light source and an optical system. The examining optical signal is a fluorescent or other optical signal imaged on the required spot.