EINRICHTUNG ZUM ELEKTROMAGNETISCHEN CHARAKTERISIEREN EINER ZU TESTENDEN STRUKTUR

A device for electromagnetic characterization of a tested structure elevates, on a predetermined frequency band, distribution parameters of the structure and parameters characteristic of the spurious rays of the structure. The device includes an electric signal generator and an analyzer for analyzin...

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Bibliographische Detailangaben
Hauptverfasser:	REINEIX, ALAIN, JEAN, LOUIS, MARTINOD, EDSON, ANTOINE, ANDRE, JECKO, BERNARD, JEAN, YVES, LALANDE-GUIONIE, MICHELE, MARIE
Format:	Patent
Sprache:	ger
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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Beschreibung
Zusammenfassung:	A device for electromagnetic characterization of a tested structure elevates, on a predetermined frequency band, distribution parameters of the structure and parameters characteristic of the spurious rays of the structure. The device includes an electric signal generator and an analyzer for analyzing the signal transmitted by the generator and signals reflected by the structure and signals transmitted by the structure. In addition, the electric signal generator is a pulsed signal generator whereof the spectrum is at least as broad as the predetermined frequency band, and the analyzer includes a filter for temporal filtering of the signals it receives, to eliminate spurious signals.