INTELLIGENTER OPTISCHER SENSOR FÜR OPTISCHE NAHFELDVORRICHTUNG

PCT No. PCT/GB94/01586 Sec. 371 Date Feb. 23, 1996 Sec. 102(e) Date Feb. 23, 1996 PCT Filed Jul. 22, 1994 PCT Pub. No. WO95/03561 PCT Pub. Date Feb. 2, 1995The disclosed optical device includes a probe which is integrally supported on a cantilever which defines an optical path extending to an extern...

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Hauptverfasser:	CASTAGNE, MICHEL, BONNAFE, JACQUES, FILLARD, JEAN, PIERRE
Format:	Patent
Sprache:	ger
Schlagworte:	APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM] INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICALDEVICES MICROSTRUCTURAL TECHNOLOGY OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS PERFORMING OPERATIONS PHYSICS SCANNING-PROBE TECHNIQUES OR APPARATUS TESTING TRANSPORTING
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creator	CASTAGNE, MICHEL BONNAFE, JACQUES FILLARD, JEAN, PIERRE
description	PCT No. PCT/GB94/01586 Sec. 371 Date Feb. 23, 1996 Sec. 102(e) Date Feb. 23, 1996 PCT Filed Jul. 22, 1994 PCT Pub. No. WO95/03561 PCT Pub. Date Feb. 2, 1995The disclosed optical device includes a probe which is integrally supported on a cantilever which defines an optical path extending to an external device which may carry an optical processor. In a preferred embodiment the device has an optical path which is capable of guiding an evanescent wave to the external device. The device overcomes a problem with prior art Scanning Tunnelling Microscopes in that, by utilizing evanescent waves, it enables access to the so called mesoscopic range between approximately 1x10-10m
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No. WO95/03561 PCT Pub. Date Feb. 2, 1995The disclosed optical device includes a probe which is integrally supported on a cantilever which defines an optical path extending to an external device which may carry an optical processor. In a preferred embodiment the device has an optical path which is capable of guiding an evanescent wave to the external device. The device overcomes a problem with prior art Scanning Tunnelling Microscopes in that, by utilizing evanescent waves, it enables access to the so called mesoscopic range between approximately 1x10-10m<-50x10-10m (1 ANGSTROM -50 ANGSTROM ). In an alternative embodiment the invention permits manipulation of microscopic particles by utilising the probe. The probe may also act as a sensor.</description><edition>6</edition><language>ger</language><subject>APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM] ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICALDEVICES ; MICROSTRUCTURAL TECHNOLOGY ; OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS ; OPTICS ; PERFORMING OPERATIONS ; PHYSICS ; SCANNING-PROBE TECHNIQUES OR APPARATUS ; TESTING ; TRANSPORTING</subject><creationdate>1998</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19981215&DB=EPODOC&CC=AT&NR=E174131T1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76318</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19981215&DB=EPODOC&CC=AT&NR=E174131T1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>CASTAGNE, MICHEL</creatorcontrib><creatorcontrib>BONNAFE, JACQUES</creatorcontrib><creatorcontrib>FILLARD, JEAN, PIERRE</creatorcontrib><title>INTELLIGENTER OPTISCHER SENSOR FÜR OPTISCHE NAHFELDVORRICHTUNG</title><description>PCT No. PCT/GB94/01586 Sec. 371 Date Feb. 23, 1996 Sec. 102(e) Date Feb. 23, 1996 PCT Filed Jul. 22, 1994 PCT Pub. No. WO95/03561 PCT Pub. Date Feb. 2, 1995The disclosed optical device includes a probe which is integrally supported on a cantilever which defines an optical path extending to an external device which may carry an optical processor. In a preferred embodiment the device has an optical path which is capable of guiding an evanescent wave to the external device. The device overcomes a problem with prior art Scanning Tunnelling Microscopes in that, by utilizing evanescent waves, it enables access to the so called mesoscopic range between approximately 1x10-10m<-50x10-10m (1 ANGSTROM -50 ANGSTROM ). In an alternative embodiment the invention permits manipulation of microscopic particles by utilising the probe. The probe may also act as a sensor.</description><subject>APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM]</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICALDEVICES</subject><subject>MICROSTRUCTURAL TECHNOLOGY</subject><subject>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</subject><subject>OPTICS</subject><subject>PERFORMING OPERATIONS</subject><subject>PHYSICS</subject><subject>SCANNING-PROBE TECHNIQUES OR APPARATUS</subject><subject>TESTING</subject><subject>TRANSPORTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1998</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLD39Atx9fHxdHcF0kEK_gEhnsHOHkBWsKtfsH-QgtvhOQhRBT9HDzdXH5cw_6AgT2ePkFA_dx4G1rTEnOJUXijNzaDo5hri7KGbWpAfn1pckJicmpdaEu8Y4mpobmJobBgSYmhMjBoANjksTg</recordid><startdate>19981215</startdate><enddate>19981215</enddate><creator>CASTAGNE, MICHEL</creator><creator>BONNAFE, JACQUES</creator><creator>FILLARD, JEAN, PIERRE</creator><scope>EVB</scope></search><sort><creationdate>19981215</creationdate><title>INTELLIGENTER OPTISCHER SENSOR FÜR OPTISCHE NAHFELDVORRICHTUNG</title><author>CASTAGNE, MICHEL ; BONNAFE, JACQUES ; FILLARD, JEAN, PIERRE</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_ATE174131TT13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>ger</language><creationdate>1998</creationdate><topic>APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM]</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICALDEVICES</topic><topic>MICROSTRUCTURAL TECHNOLOGY</topic><topic>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</topic><topic>OPTICS</topic><topic>PERFORMING OPERATIONS</topic><topic>PHYSICS</topic><topic>SCANNING-PROBE TECHNIQUES OR APPARATUS</topic><topic>TESTING</topic><topic>TRANSPORTING</topic><toplevel>online_resources</toplevel><creatorcontrib>CASTAGNE, MICHEL</creatorcontrib><creatorcontrib>BONNAFE, JACQUES</creatorcontrib><creatorcontrib>FILLARD, JEAN, PIERRE</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>CASTAGNE, MICHEL</au><au>BONNAFE, JACQUES</au><au>FILLARD, JEAN, PIERRE</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>INTELLIGENTER OPTISCHER SENSOR FÜR OPTISCHE NAHFELDVORRICHTUNG</title><date>1998-12-15</date><risdate>1998</risdate><abstract>PCT No. PCT/GB94/01586 Sec. 371 Date Feb. 23, 1996 Sec. 102(e) Date Feb. 23, 1996 PCT Filed Jul. 22, 1994 PCT Pub. No. WO95/03561 PCT Pub. Date Feb. 2, 1995The disclosed optical device includes a probe which is integrally supported on a cantilever which defines an optical path extending to an external device which may carry an optical processor. In a preferred embodiment the device has an optical path which is capable of guiding an evanescent wave to the external device. The device overcomes a problem with prior art Scanning Tunnelling Microscopes in that, by utilizing evanescent waves, it enables access to the so called mesoscopic range between approximately 1x10-10m<-50x10-10m (1 ANGSTROM -50 ANGSTROM ). In an alternative embodiment the invention permits manipulation of microscopic particles by utilising the probe. The probe may also act as a sensor.</abstract><edition>6</edition><oa>free_for_read</oa></addata></record>
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subjects	APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM] INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICALDEVICES MICROSTRUCTURAL TECHNOLOGY OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS PERFORMING OPERATIONS PHYSICS SCANNING-PROBE TECHNIQUES OR APPARATUS TESTING TRANSPORTING
title	INTELLIGENTER OPTISCHER SENSOR FÜR OPTISCHE NAHFELDVORRICHTUNG
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