PIEZOELEKTRISCHES MESSELEMENT

In piecoelectric measuring elements comprising two or more crystal elements that are jointly subject to the mechanical variable to be measured and are provided with electrically conductive electrodes on opposite surfaces located essentially normal to the electric (x) axes of these crystal elements,...

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Bibliographische Detailangaben
Hauptverfasser: LIST HELMUT, ENGEL GUENTER.DR, KREMPL PETER W. DR
Format: Patent
Sprache:ger
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Zusammenfassung:In piecoelectric measuring elements comprising two or more crystal elements that are jointly subject to the mechanical variable to be measured and are provided with electrically conductive electrodes on opposite surfaces located essentially normal to the electric (x) axes of these crystal elements, disadvantages arising from shearing stresses can be prevented by using crystal elements (2) from crystals of point group 32, in which exist two opposite types of enantiomorphism, l and r, in which part of the crystal elements used belong to one of the two enantiomorphic types l or r, and have one of the two absolute orientations of the x-axis, alpha 1 or alpha 2, while the remaining crystal elements belong to the opposite enantiomorphic type and have the opposite orientation of the x-axis.