Interface Conduction between Conductive ReO3 Thin Films and NdBa2Cu3O6 Thin Film
The Re oxide films were deposited on quartz glasses by RF reactive sputtering from a Re metal target. The lowest resistivity was observed in the film in-situ annealed at 200 deg. C in Ar atmosphere and showed the order of 10(exp -4) Ohm cm of which the value was still about 10 times as large as that...
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Zusammenfassung: | The Re oxide films were deposited on quartz glasses by RF reactive sputtering from a Re metal target. The lowest resistivity was observed in the film in-situ annealed at 200 deg. C in Ar atmosphere and showed the order of 10(exp -4) Ohm cm of which the value was still about 10 times as large as that of a single crystal ReO3. The temperature dependence of the resistivity revealed a metallic behavior A superconductivity did not take place in the bilayered film of ReO3/NdBa2Cu3O6. In the interface region the resistivity minimum probably caused by the Kondo effect was observed in the neighborhood of 120K.
This article is from the Mat. Res. Soc. Symposium Proceedings, v740 p125-130. This article is from ADA417952 Materials Research Society Symposium Proceedings Volume 740 Held in Boston, Massachusetts on December 2-6, 2002. Nanomaterials for Structural Applications |
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