The Detection of Doped Cr Presence in Sr(0.6)Ba(0.4)Nb2O3 by SIMS

Photorefractive materials like SrBaNb (SBN) have optical properties that can have several military applications. To improve the figures of merit for these materials, it is very important to have better control of Cr dopant in the SBN. Since the amount of Cr dopant is so small, the usual analytical t...

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Bibliographische Detailangaben
1. Verfasser:	Lee, Unchul
Format:	Report
Sprache:	eng
Schlagworte:	BARIUM Ceramics, Refractories and Glass CHROMIUM CRYSTAL GROWTH DETECTION DOPING ELECTRON GUNS MASS SPECTROMETRY MILITARY APPLICATIONS NIOBATES OPTICAL MATERIALS OPTICAL PROPERTIES Optics PE62705A PHOTOREFRACTIVE MATERIALS SBN(STRONTIUM BARIUM NIOBATE) CRYSTALS SIMS(SECONDARY ION MASS SPECTROMETRY) STRONTIUM COMPOUNDS
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Zusammenfassung:	Photorefractive materials like SrBaNb (SBN) have optical properties that can have several military applications. To improve the figures of merit for these materials, it is very important to have better control of Cr dopant in the SBN. Since the amount of Cr dopant is so small, the usual analytical techniques are not adequate to analyze this material. In this report, the incorporation of Cr into SBN using secondary ion mass spectrometry (SIMS) measurement with an electron gun is confirmed.