Production Engineering Measure for an Electron-Beam Machine and Microwave Transistors

During the eighth quarter of this contract, significant achievements included initial evaluation of transistors for First Article Samples and improvements in transistor yield. Modifications to the E-beam machine and imaging procedure markedly improved definition and alignment of transistors.

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Bibliographische Detailangaben
Hauptverfasser: Pankratz, John M, Creagh, Linda T, Varnell, Gilbert L
Format: Report
Sprache:eng
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Zusammenfassung:During the eighth quarter of this contract, significant achievements included initial evaluation of transistors for First Article Samples and improvements in transistor yield. Modifications to the E-beam machine and imaging procedure markedly improved definition and alignment of transistors.