A Rapid X-ray Diffractometer Method for Monitoring the Purity of NH4ClO4

A Rapid X-ray Diffractometer Method for Monitoring the Purity of NH4ClO4

The lattice parameters of six samples of NH4ClO4 and NH4ClO4/KclO4 solid solutions were determined by means of the wide angle X-ray diffractometer using fixed count techniques. This method of data retrieval using 1600 counts measured at 0.05 degrees 2 theta increments required about 10 minutes per r...

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Bibliographische Detailangaben
Hauptverfasser: Bracuti ,Arthur J, Campisi,Joseph
Format: Report
Sprache:eng
Schlagworte:
Ammonium perchlorate
Crystal structure
Lattice parameters
Perchlorates
Physical Chemistry
Potassium compounds
Potassium perchlorate
Purity
X ray diffraction
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Zusammenfassung:The lattice parameters of six samples of NH4ClO4 and NH4ClO4/KclO4 solid solutions were determined by means of the wide angle X-ray diffractometer using fixed count techniques. This method of data retrieval using 1600 counts measured at 0.05 degrees 2 theta increments required about 10 minutes per reflection. The approximation method was employed for all calculations. The results indicated that this technique could be used to monitor the purity of NH4ClO4 with regard to KClO4 as solute in the NH4ClO4/KClO4 solid solution system. (Author)