Transmission Microscopy of Ion-Bombardment Thinned Boron Carbide

The use of the ion-bombardment etching technique to thin boron carbide ceramics for transmitted light optical and transmission electron microscopy is demonstnated. The results of the transmission electron microscopy provide the first direct evidence of the existence of dislocations in boron carbide....

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Bibliographische Detailangaben
Hauptverfasser: Katz,R. Nathan, King,Abram O
Format: Report
Sprache:eng
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Zusammenfassung:The use of the ion-bombardment etching technique to thin boron carbide ceramics for transmitted light optical and transmission electron microscopy is demonstnated. The results of the transmission electron microscopy provide the first direct evidence of the existence of dislocations in boron carbide. (Author)