Basic Phenomenological Theory of the Optical Properties of Thin Films (Osnovy Fenomenologicheskoi Teorii Opticheskikh Svoistv Tonkikh Pokrytii)

Basic Phenomenological Theory of the Optical Properties of Thin Films (Osnovy Fenomenologicheskoi Teorii Opticheskikh Svoistv Tonkikh Pokrytii)

The optical properties of thin films used in interferometry are examined from the viewpoint of phenomenological theory to assist in revealing the nature of the basic optical properties of thin films and in preparing the groundwork for determination of the causes of the numberous anomalies inherent t...

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Bibliographische Detailangaben
1. Verfasser: Rozenberg,G. V
Format: Report
Sprache:eng
Schlagworte:
DIELECTRIC FILMS
INTERFEROMETERS
LIGHT TRANSMISSION
METAL FILMS
OPTICAL PROPERTIES
Optics
REFLECTION
REFRACTION
THIN FILMS
TRANSLATIONS
USSR
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Beschreibung
Zusammenfassung:The optical properties of thin films used in interferometry are examined from the viewpoint of phenomenological theory to assist in revealing the nature of the basic optical properties of thin films and in preparing the groundwork for determination of the causes of the numberous anomalies inherent to them. The content of phenomenological theory is calculation of the phase path of a wave propagating within a layer and conditions of reflection on its boundaries. (Author) Trans. of mono. Optika Tonkosloinykh Pokrytii, n.p., 1958 p62-105.