FAST LOGIC CIRCUIT TEST ASSEMBLY

This document describes the Fast Logic Circuit Test Assembly built to evaluate the system operating characteristics of nanosecond switching circuits which have been developed at The MITRE Corporation. The Test Assembly, which includes most of the classes of logic functions which might be encountered in a full scale serial or parallel computer, will also serve as a vehicle for evaluation of circuit reliability and for signal and power distribution methods. The Test Assembly includes two serial registers which use electromagnetic delay line storage. The shift registers, associated with these delay lines to implement the serial-to-parallel conversion or vice versa, shift at a 100-mc rate. Also included, in addition to a 100-mc counter and various control networks, is an 8-bit parallel adder which may be expanded using identical adder modules to form a 64-bit adder with 30-nanosecond addition time.