STACKING FAULTS

All original experimental, analytical, and theoretical work performed on Stacking Faults in Crystalline Materials is summarized. Highlights of this project are listed and references are made to publications in the open literature, abstracts, discussions, and invited presentation where details are elaborated. Experimental work was primarily performed using X-ray diffraction and electron microscopy techniques. Materials investigated included 70:30 brass, Cu-6.6 atomic percent Si, niobium, tantalum, cerium, alpha-uranium, carbon, and boron. Theoretical and analytical studies were also performed to identify the contribution of faults, twins and thin platelets to diffraction phenomena and to standardize the terminology in indexing the hexagonal system. (Author)