A FUNDAMENTAL STUDY OF EPITAXY BY FLASH EVAPORATION

Electrical measurements have been made on InSb films deposited on mica substrates. The perfection of isoepitaxially deposited InSb films has been studied using X-ray double diffractometer methods. Films of high crystalline quality have been deposited. (Author)

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Bibliographische Detailangaben
1. Verfasser:	Richards,John L
Format:	Report
Sprache:	eng
Schlagworte:	ANTIMONY ALLOYS CRYSTALLOGRAPHY ELECTRICAL PROPERTIES EPITAXIAL GROWTH EVAPORATION EXPERIMENTAL DATA HALL EFFECT INDIUM ALLOYS INDIUM ANTIMONIDE MICA SEMICONDUCTING FILMS TEMPERATURE THICKNESS X RAY DIFFRACTION
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Beschreibung
Zusammenfassung:	Electrical measurements have been made on InSb films deposited on mica substrates. The perfection of isoepitaxially deposited InSb films has been studied using X-ray double diffractometer methods. Films of high crystalline quality have been deposited. (Author)