THE RELIABILITY OF ELECTRONIC COMPONENTS FOR USE IN REMINGTON RAND UNIVAC GROUND-BASED COMPUTER SYSTEMS: VOLUME VI: PHASE III, THE DEVELOPMENT OF COMPONENT-SCREENING TECHNIQUES

This report describes a research program directed toward the development of techniques for detecting inherently weak transistors, diodes, and resistors before they are used in the computer system. The results of this research have indicated that screening techniques based on initial parameter measur...

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