THE RELIABILITY OF ELECTRONIC COMPONENTS FOR USE IN REMINGTON RAND UNIVAC GROUND-BASED COMPUTER SYSTEMS: VOLUME VI: PHASE III, THE DEVELOPMENT OF COMPONENT-SCREENING TECHNIQUES

THE RELIABILITY OF ELECTRONIC COMPONENTS FOR USE IN REMINGTON RAND UNIVAC GROUND-BASED COMPUTER SYSTEMS: VOLUME VI: PHASE III, THE DEVELOPMENT OF COMPONENT-SCREENING TECHNIQUES

This report describes a research program directed toward the development of techniques for detecting inherently weak transistors, diodes, and resistors before they are used in the computer system. The results of this research have indicated that screening techniques based on initial parameter measur...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Drennan,J E, Chapin,W E, Thomas,R E, Braner,H M, Hassler,K E
Format: Report
Sprache:eng
Schlagworte:
ALGEBRA
COMPUTER PROGRAMMING
COMPUTERS
DIGITAL COMPUTERS
DIODES
ELECTRONIC EQUIPMENT
FAILURE(MECHANICS)
LIFE EXPECTANCY(SERVICE LIFE)
MATHEMATICAL PREDICTION
QUALITY CONTROL
RELIABILITY(ELECTRONICS)
RESISTORS
STATISTICAL ANALYSIS
STRESSES
TEST METHODS
TRANSISTORS
UNIVAC
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:This report describes a research program directed toward the development of techniques for detecting inherently weak transistors, diodes, and resistors before they are used in the computer system. The results of this research have indicated that screening techniques based on initial parameter measurements are feasible. Trail applications of the techniques on data from exploratory and simulated-use life tests indicate that it may be possible to classify correctly as many as 80 per cent of the components destined for early failure in use. (Author) Subcontract to Remington Rand Univac, St. Paul, Minn.