RADIATION-EFFECTS RELIABILITY AND DATA ANALYSIS TECHNIQUES

RADIATION-EFFECTS RELIABILITY AND DATA ANALYSIS TECHNIQUES

The applicability of standard mathematical techniques for analysis of reliability of components exposed to a radiation environment is presented. The sensitivity of failure-distribution functions, data-presentation techniques, statistical parameters, and types of measurements to practical analysis me...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Wattier, J B, Ingram, R D, York, L J, Owens, W R
Format: Report
Sprache:eng
Schlagworte:
DAMAGE
FAILURE(MECHANICS)
GAMMA RAYS
MATHEMATICAL ANALYSIS
MATHEMATICAL MODELS
NEUTRONS
Operations Research
PROBABILITY
RADIATION EFFECTS
RELIABILITY
SEMICONDUCTOR DIODES
SENSITIVITY
SPECIAL FUNCTIONS(MATHEMATICS)
STATISTICAL ANALYSIS
STATISTICAL FUNCTIONS
TRANSIENT RADIATION EFFECTS (ELECTRONICS)
TRANSISTORS
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Beschreibung
Zusammenfassung:The applicability of standard mathematical techniques for analysis of reliability of components exposed to a radiation environment is presented. The sensitivity of failure-distribution functions, data-presentation techniques, statistical parameters, and types of measurements to practical analysis methods is demonstrated. With the insight gained from the analysis methods, a research and development program was designed to establish qualified test procedures for long-term nucleardevelopment techniques. In addition, the lack of practical standard test techniques is substantiated and standard data-reporting methods are recommended.