Topography and nanomechanical properties of Pd-C films
Atomic force microscopy (AFM) topographical studies and results of nanoindentation experiment for several palladium-carbon films (Pd-C film) deposited on various substrates and with varying palladium content are presented. Pd-C films were prepared by a physical vapor decomposition (PVD) process and...
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Veröffentlicht in: | Central European journal of physics 2011-04, Vol.9 (2), p.300-306 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | Atomic force microscopy (AFM) topographical studies and results of nanoindentation experiment for several palladium-carbon films (Pd-C film) deposited on various substrates and with varying palladium content are presented. Pd-C films were prepared by a physical vapor decomposition (PVD) process and next were modified by a chemical vapor decomposition (CVD) method to obtain carbonaceous porous structure with dispersed palladium nanograins and a variation in roughness.
The dependence of film topography on the kind of substrate such as Al
2
O
3
, Mo polycrystalline foil and fused silica was studied by AFM. Nanomechanical properties such as hardness and the reduced indentation modulus were determined by nanoindentation. A comparison of these values for films with different Pd content deposited on various substrates is presented. |
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ISSN: | 1895-1082 2391-5471 1644-3608 2391-5471 |
DOI: | 10.2478/s11534-010-0134-5 |