Topography and nanomechanical properties of Pd-C films

Atomic force microscopy (AFM) topographical studies and results of nanoindentation experiment for several palladium-carbon films (Pd-C film) deposited on various substrates and with varying palladium content are presented. Pd-C films were prepared by a physical vapor decomposition (PVD) process and...

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Veröffentlicht in:Central European journal of physics 2011-04, Vol.9 (2), p.300-306
Hauptverfasser: Rymarczyk, Joanna, Czerwosz, Elzbieta, Richter, Asta
Format: Artikel
Sprache:eng
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Zusammenfassung:Atomic force microscopy (AFM) topographical studies and results of nanoindentation experiment for several palladium-carbon films (Pd-C film) deposited on various substrates and with varying palladium content are presented. Pd-C films were prepared by a physical vapor decomposition (PVD) process and next were modified by a chemical vapor decomposition (CVD) method to obtain carbonaceous porous structure with dispersed palladium nanograins and a variation in roughness. The dependence of film topography on the kind of substrate such as Al 2 O 3 , Mo polycrystalline foil and fused silica was studied by AFM. Nanomechanical properties such as hardness and the reduced indentation modulus were determined by nanoindentation. A comparison of these values for films with different Pd content deposited on various substrates is presented.
ISSN:1895-1082
2391-5471
1644-3608
2391-5471
DOI:10.2478/s11534-010-0134-5