Minimisation of Parasitic Capacitance in Lumped-Element Electro-Absorption Modulators for High-Speed Optical Components

This paper presents an investigation into the parasitic capacitance of an RF contact scheme for lumped-element EAMs. Test structures are fabricated to analyse this parasitic capacitance via S11 characterisation using a vector network analyser (VNA). Optimisations of the contact scheme lead to the pa...

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Veröffentlicht in:Photonics 2023-08, Vol.10 (8), p.885
Hauptverfasser: Mulcahy, Jack, Shi, Shengtai, Peters, Frank H., Dai, Xing
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Sprache:eng
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Zusammenfassung:This paper presents an investigation into the parasitic capacitance of an RF contact scheme for lumped-element EAMs. Test structures are fabricated to analyse this parasitic capacitance via S11 characterisation using a vector network analyser (VNA). Optimisations of the contact scheme lead to the parasitic capacitance being reduced to
ISSN:2304-6732
2304-6732
DOI:10.3390/photonics10080885