FORECASTING METHOD OF PARAMETRIC Reliability of electronic devices BY MODEL OF functional parameter'S DEGRADATION

The method of obtaining the model, describing degradation regularity for function parameter of electronic device (ED) sample, was systematized. The probability distribution function (for operating time of interest) of function parameter of ED sample is considered as a model of degradation. On the basis of the method the technique for prediction of parametric reliability of new ED samples was developed. It can be used for new samples of ED of the same type, but which did not participate in preliminary research/investigations. Prediction is obtained as the probability of the fact, when functional parameter of any device in a sample will have the value within the specified limits after specified operating time.