PCB Soldering Defect Inspection Using Multitask Learning under Low Data Regimes
To increase the reliability of the printed circuit board (PCB) manufacturing process, automated optical inspection is often employed for soldering defect detection. However, traditional approaches built on handcrafted features, predefined rules, or thresholds are often susceptible to the variation o...
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Veröffentlicht in: | Advanced Intelligent Systems 2023-12, Vol.5 (12), p.n/a |
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Sprache: | eng |
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Zusammenfassung: | To increase the reliability of the printed circuit board (PCB) manufacturing process, automated optical inspection is often employed for soldering defect detection. However, traditional approaches built on handcrafted features, predefined rules, or thresholds are often susceptible to the variation of the acquired images’ quality and give unstable performances. To solve this problem, a deep learning‐based soldering defect detection method is developed in this article. Like many real‐life deep learning applications, the number of available training samples is often limited. This creates a challenging low‐data scenario, as deep learning typically requires massive data to perform well. To address this issue, a multitask learning model is proposed, namely, PCBMTL, that can simultaneously learn the classification and segmentation tasks under low‐data regimes. By acquiring the segmentation knowledge, classification performance is substantially improved with few samples. To facilitate the study, a soldering defect image dataset, namely, PCBSPDefect, is built. It focuses on the dual in‐line packages (DIP) at the PCB back side, DIP at the PCB front side, and flat flexible cables. Experimental results show that the proposed PCBMTL outperforms the best existing approaches by over 5–17% of average accuracy for different datasets.
For inspecting printed circuit boards having solder joint defects, a multitask learning model is proposed. The model simultaneously learns the classification and segmentation tasks to allow it to perform even if only little training data are available. By acquiring the segmentation knowledge, the classification performance of the proposed model is significantly improved, outperforming existing approaches, particularly under low‐data regimes. |
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ISSN: | 2640-4567 2640-4567 |
DOI: | 10.1002/aisy.202300364 |