Microdetector system for speedy X-ray studies

Characteristics of 512-channel micro-detection system for the study of fast processes in metals during heating/cooling at high-speed radiography installation was presented. The position, width and intensity of diffraction peaks of the scattered X-rays was measured and displayed in real time dependin...

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Veröffentlicht in:	I͡A︡derna fizyka ta enerhetyka 2016-12, Vol.17 (4), p.400-405
Hauptverfasser:	Kovalchuk, O.S., Burdin, V.V., Kyva, V.A., Militsiya, V.M., Minakov, M.V., Petrenko, Ie.O., Pugatch, V.M., Storozhyk, D.I., Heuser, J., Firstov, S.O., Chaus, A.V.
Format:	Artikel
Sprache:	eng
Schlagworte:	microstrip silicon detectors position sensitive detectors temperature dependence of phase transformations in metals transient phase transformations X-rays diffraction
Online-Zugang:	Volltext
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Beschreibung
Zusammenfassung:	Characteristics of 512-channel micro-detection system for the study of fast processes in metals during heating/cooling at high-speed radiography installation was presented. The position, width and intensity of diffraction peaks of the scattered X-rays was measured and displayed in real time depending on the temperature of the test sample (20 - 1500 °C). The position sensitivity of the system based on silicon microstrip sensors read out by commercial XDAS data acquisition system is 40 μm for the scattering angle of X-rays 30° < Θ < 75°.
ISSN:	1818-331X 2074-0565
DOI:	10.15407/jnpae2016.04.400