Modeling, simulation and experimental exploration of metal magnetic memory under weak magnetic excitation

This study proposes to use the improved Jiles–Atherton (J–A) magneto-mechanical effect model combined with simulation analysis to detect the damage of wire rope. By establishing the theoretical basis of the J–A model under weak magnetic excitation, the simulation analysis is carried out by using ANS...

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Veröffentlicht in:SN applied sciences 2022-06, Vol.4 (6), p.1-13, Article 167
Hauptverfasser: Liu, Bo, Zhang, Juwei, Zhang, Zengguang
Format: Artikel
Sprache:eng
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Zusammenfassung:This study proposes to use the improved Jiles–Atherton (J–A) magneto-mechanical effect model combined with simulation analysis to detect the damage of wire rope. By establishing the theoretical basis of the J–A model under weak magnetic excitation, the simulation analysis is carried out by using ANSYS software, and finally the correctness of the simulation and theoretical results is verified by experiments. The results show that the weak magnetic excitation magnetic field has a strengthening effect on the magnetic memory signal under the action of the force-magnetic coupling. By processing the extracted magnetic memory signal, it is verified that the weak magnetic excitation magnetic field alone has a certain inhibitory effect on the environmental interference of the geomagnetic field. Compared with the geomagnetic field environment, the weak magnetic excitation magnetic field can better identify the different defect types of simulated 60 steel damage and wire rope defects. Studies have shown that weak magnetic excitation plays an important role in the damage detection of ferromagnetic materials. Article highlights Improve and establish the theoretical model of J–A magneto-mechanical effect under weak magnetic excitation. Magnetic memory signal can distinguish different damage types, and weak magnetic excitation can strengthen magnetic memory signal. Force-magnetic coupling experiment verifies the effectiveness of weak magnetic excitation field in defect identification.
ISSN:2523-3963
2523-3971
DOI:10.1007/s42452-022-05059-z