Integrated 2D multi-fin field-effect transistors
Vertical semiconducting fins integrated with high- κ oxide dielectrics have been at the centre of the key device architecture that has promoted advanced transistor scaling during the last decades. Single-fin channels based on two-dimensional (2D) semiconductors are expected to offer unique advantage...
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Veröffentlicht in: | Nature communications 2024-04, Vol.15 (1), p.3622-3622, Article 3622 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | Vertical semiconducting fins integrated with high-
κ
oxide dielectrics have been at the centre of the key device architecture that has promoted advanced transistor scaling during the last decades. Single-fin channels based on two-dimensional (2D) semiconductors are expected to offer unique advantages in achieving sub-1 nm fin-width and atomically flat interfaces, resulting in superior performance and potentially high-density integration. However, multi-fin structures integrated with high-
κ
dielectrics are commonly required to achieve higher electrical performance and integration density. Here we report a ledge-guided epitaxy strategy for growing high-density, mono-oriented 2D Bi
2
O
2
Se fin arrays that can be used to fabricate integrated 2D multi-fin field-effect transistors. Aligned substrate steps enabled precise control of both nucleation sites and orientation of 2D fin arrays. Multi-channel 2D fin field-effect transistors based on epitaxially integrated 2D Bi
2
O
2
Se/Bi
2
SeO
5
fin-oxide heterostructures were fabricated, exhibiting an on/off current ratio greater than 10
6
, high on-state current, low off-state current, and high durability. 2D multi-fin channel arrays integrated with high-
κ
oxide dielectrics offer a strategy to improve the device performance and integration density in ultrascaled 2D electronics.
Here, the authors report the ledge-guided epitaxial growth of high-density 2D Bi
2
O
2
Se fin arrays and their application for the realization of 2D multi-channel fin field-effect transistors, showing improved on-state currents as the number of integrated channels is increased. |
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ISSN: | 2041-1723 2041-1723 |
DOI: | 10.1038/s41467-024-47974-2 |