Growth and Characterization of Centimeter-Scale Pentacene Crystals for Optoelectronic Devices

In this work, we present results on the growth of centimeter-scale pentacene crystals using the physical vapor transport method in a dual-temperature zone horizontal furnace. It was established that intensive crystal growth processes occurred in transition regions with sudden temperature changes, wh...

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Veröffentlicht in:Crystals (Basel) 2023-07, Vol.13 (7), p.999
Hauptverfasser: Postnikov, Valery A., Kulishov, Artem A., Yurasik, Georgy A., Sorokina, Nataliya I., Sorokin, Timofei A., Grebenev, Vadim V.
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Sprache:eng
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Zusammenfassung:In this work, we present results on the growth of centimeter-scale pentacene crystals using the physical vapor transport method in a dual-temperature zone horizontal furnace. It was established that intensive crystal growth processes occurred in transition regions with sudden temperature changes, while crystal growth was practically not observed in regions with slightly varying temperatures. During crystal growth, co-precipitating golden needle-like crystals reaching lengths of more than 10 mm were obtained. Using the method of single-crystal X-ray diffraction at 85 and 293 K for dark-blue lamellar pentacene crystals, the crystal structure was refined in a triclinic system with sp.gr. P1¯. It was established that the golden needle crystals consisted of molecules of the pentacene derivative—5,14-pentacenedione, the crystal structure of which was solved for the first time in a rhombic system with sp.gr. P212121. The absorption and luminescence spectra of pentacene and 5,14-pentacenedione in toluene solutions were obtained and analyzed. The electrical properties of the prepared pentacene thin films and single crystals grown under physical vapor transport conditions were evaluated by fabricating and characterizing field-effect transistors (FETs). It was shown that the presence of impurities in the commercial pentacene material had a significant effect on the morphological quality of thin polycrystalline films and noticeably reduced the hole mobility.
ISSN:2073-4352
2073-4352
DOI:10.3390/cryst13070999