Trap-assisted tunnelling current in MIM structures

A new model is presented of current transport in Metal Insulator Metal (MIM) structures by quantum mechanical tunnelling. In addition to direct tunnelling through an insulating layer, tunnelling via defects present in the insulating layer plays an important role. Examples of the influence of the mat...

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Veröffentlicht in:	Central European journal of physics 2011-02, Vol.9 (1), p.230-241
Hauptverfasser:	Racko, Juraj, Mikolášek, Miroslav, Granzner, Ralf, Breza, Juraj, Donoval, Daniel, Grmanová, Alena, Harmatha, Ladislav, Schwierz, Frank, Fröhlich, Karol
Format:	Artikel
Sprache:	eng
Schlagworte:	Biological and Medical Physics Biophysics Environmental Physics Geophysics/Geodesy high-permittivity dielectrics I-V characteristics MIM Physical Chemistry Physics Physics and Astronomy Research Article trap-assisted tunnelling
Online-Zugang:	Volltext
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Beschreibung
Zusammenfassung:	A new model is presented of current transport in Metal Insulator Metal (MIM) structures by quantum mechanical tunnelling. In addition to direct tunnelling through an insulating layer, tunnelling via defects present in the insulating layer plays an important role. Examples of the influence of the material and thickness of the insulating layer, energy distribution of traps, and metal work functions are also provided.
ISSN:	1895-1082 2391-5471 1644-3608 2391-5471
DOI:	10.2478/s11534-010-0027-7