ESTIMATION OF SAMPLE SPACING IN STOCHASTIC PROCESSES

Motivated by applications in electron microscopy, we study the situation where a stationary and isotropic random field is observed on two parallel planes with unknown distance. We propose an estimator for this distance. Under the tractable, yet flexible class of Lévy-based random field models, we de...

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Veröffentlicht in:Image analysis & stereology 2017-01, Vol.36 (1), p.43-49
Hauptverfasser: Rønn-Nielsen, Anders, Sporring, Jon, B. Vedel Jensen, Eva
Format: Artikel
Sprache:eng
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Zusammenfassung:Motivated by applications in electron microscopy, we study the situation where a stationary and isotropic random field is observed on two parallel planes with unknown distance. We propose an estimator for this distance. Under the tractable, yet flexible class of Lévy-based random field models, we derive an approximate variance of the estimator. The estimator and the approximate variance perform well in two simulation studies.
ISSN:1580-3139
1854-5165
DOI:10.5566/ias.1681