Single-Shot Imaging of Two-Wavelength Spatial Phase-Shifting Interferometry

In this investigation, we propose an effective method to measure 3D surface profiles of specimens with single-shot imaging. Based on the two-wavelength interferometric principle and spatial phase-shifting technique using a polarization pixelated camera, the proposed system can not only rapidly measu...

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Veröffentlicht in:Sensors (Basel, Switzerland) Switzerland), 2019-11, Vol.19 (23), p.5094
Hauptverfasser: Jeon, Jun Woo, Joo, Ki-Nam
Format: Artikel
Sprache:eng
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Zusammenfassung:In this investigation, we propose an effective method to measure 3D surface profiles of specimens with single-shot imaging. Based on the two-wavelength interferometric principle and spatial phase-shifting technique using a polarization pixelated camera, the proposed system can not only rapidly measure the phase, but also overcome the 2π-ambiguity problem of typical phase-shifting interferometry. The rough surface profile can be calculated by the visibility of the interference fringe and can compensate for the height discontinuity by phase jumps occurring in a fine height map. An inclined plane mirror and a step height specimen with 9 μm were used for the validation of capability of measuring continuously smooth surface and large step heights. The measurement results were in good agreement with the results of typical two-wavelength interferometry.
ISSN:1424-8220
1424-8220
DOI:10.3390/s19235094