Interlayer Difference of Bilayer-Stacked MoS2 Structure: Probing by Photoluminescence and Raman Spectroscopy

This work reports the interlayer difference of exciton and phonon performance between the top and bottom layer of a bilayer-stacked two-dimensional materials structure (BSS). Through photoluminescence (PL) and Raman spectroscopy, we find that, compared to that of the bottom layer, the top layer of B...

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Veröffentlicht in:Nanomaterials (Basel, Switzerland) Switzerland), 2019-05, Vol.9 (5), p.796
Hauptverfasser: Zhang, Xiangzhe, Zhang, Renyan, Zheng, Xiaoming, Zhang, Yi, Zhang, Xueao, Deng, Chuyun, Qin, Shiqiao, Yang, Hang
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Sprache:eng
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Zusammenfassung:This work reports the interlayer difference of exciton and phonon performance between the top and bottom layer of a bilayer-stacked two-dimensional materials structure (BSS). Through photoluminescence (PL) and Raman spectroscopy, we find that, compared to that of the bottom layer, the top layer of BSS demonstrates PL redshift, Raman E 2 g 1 mode redshift, and lower PL intensity. Spatial inhomogeneity of PL and Raman are also observed in the BSS. Based on theoretical analysis, these exotic effects can be attributed to substrate-coupling-induced strain and doping. Our findings provide pertinent insight into film–substrate interaction, and are of great significance to researches on bilayer-stacked structures including twisted bilayer structure, Van der Waals hetero- and homo-structure.
ISSN:2079-4991
2079-4991
DOI:10.3390/nano9050796