Improvement of Fresnel zone plate beam-profile monitor and application to ultralow emittance beam profile measurements

We describe the improvements of a Fresnel zone plate (FZP) beam-profile monitor, which is being developed at the KEK-ATF damping ring to measure ultralow emittance electron-beam profiles. This monitor, which is designed to have a submicrometer spatial resolution, is based on x-ray imaging optics com...

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Veröffentlicht in:Physical review special topics. PRST-AB. Accelerators and beams 2007-04, Vol.10 (4), p.042801, Article 042801
Hauptverfasser: Sakai, Hiroshi, Fujisawa, Masami, Iida, Kensuke, Ito, Isao, Kudo, Hirofumi, Nakamura, Norio, Shinoe, Kenji, Tanaka, Takeo, Hayano, Hitoshi, Kuriki, Masao, Muto, Toshiya
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Sprache:eng
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Zusammenfassung:We describe the improvements of a Fresnel zone plate (FZP) beam-profile monitor, which is being developed at the KEK-ATF damping ring to measure ultralow emittance electron-beam profiles. This monitor, which is designed to have a submicrometer spatial resolution, is based on x-ray imaging optics composed of two FZPs. Various improvements were performed to the old setup. First, a new crystal monochromator was introduced to suppress the beam image drift. Second, the two FZP folders were improved in order to realize a precise beam-based alignment during x-ray imaging. Third, a fast mechanical shutter was installed to achieve a shorter time resolution, and an x-ray mask system was also installed to obstruct direct synchrotron radiation through the FZPs. These improvements could make beam-profile measurements more precise and reliable. The beam profiles with less than 50μm horizontal beam size and less than 6μm vertical beam size could be measured within a 1 ms time duration. Furthermore, measurements of the damping time and the coupling dependence of the ATF damping ring were successfully carried out with this upgraded FZP monitor.
ISSN:1098-4402
1098-4402
2469-9888
DOI:10.1103/PhysRevSTAB.10.042801