Indirect detector for ultra‐high‐speed X‐ray micro‐imaging with increased sensitivity to near‐ultraviolet scintillator emission

Ultra‐high‐speed synchrotron‐based hard X‐ray (i.e. above 10 keV) imaging is gaining a growing interest in a number of scientific domains for tracking non‐repeatable dynamic phenomena at spatio‐temporal microscales. This work describes an optimized indirect X‐ray imaging microscope designed to achieve high performance at micrometre pixel size and megahertz acquisition speed. The entire detector optical arrangement has an improved sensitivity within the near‐ultraviolet (NUV) part of the emitted spectrum (i.e. 310–430 nm wavelength). When combined with a single‐crystal fast‐decay scintillator, such as LYSO:Ce (Lu2−xYxSiO5:Ce), it exploits the potential of the NUV light‐emitting scintillators. The indirect arrangement of the detector makes it suitable for high‐dose applications that require high‐energy illumination. This allows for synchrotron single‐bunch hard X‐ray imaging to be performed with improved true spatial resolution, as herein exemplified through pulsed wire explosion and superheated near‐nozzle gasoline injection experiments at a pixel size of 3.2 µm, acquisition rates up to 1.4 MHz and effective exposure time down to 60 ps. This study introduces an optimized indirect X‐ray microscope capable of achieving micrometre pixel size and megahertz acquisition speed, leveraging enhanced sensitivity in the near‐ultraviolet spectrum and single‐crystal fast‐decay scintillators. This development enables high‐resolution imaging for dynamic phenomena, exemplified by experiments with pulsed wire explosion and superheated near‐nozzle gasoline injection.